EQUOTIP® 550 Portable D.I.D. (Rockwell Principle)

Sun-Tec Portable LEEB-UCI Tester EQUOTIP® 550 Portable D.I.D. (Rockwell Principle)
Proceq

EQUOTIP® 550 Portable D.I.D. (Rockwell Principle)

Equotip enables portable hardness inspection of almost any object, polished parts and heat-treated surfaces. The hardness measurements are made by using the static Portable D.I.D. (“Rockwell” principal) hardness test. The rugged Swiss-made metal NDT hardness testers are designed for portable hardness testing in the lab, in the workshop, at production facilities or on site.

Applications:

Hardness testing of thin metal sheets and wires / Hardness testing of casts, flanges, shafts, and bars/pipes / Quality and wear control of turbine blades and brake systems

Special Features

  • Specially For Thin Parts
      Particularly suited for scratch-sensitive and polished parts or on thin parts, profiles and pipes. The required minimum thickness for a reliable hardness reading is ten times the indentation depth. For the mass there is no minimum requirements.
  • Suits Various Sample Geometries
      Unique measuring clamp and support feet are available for the probe allowing tests to be carried out on various geometries.
  • Broad Hardness Scales Coverage
      Measurements in HRC and HV with automatic integrated conversions to HB, HRA, HRB and many more common scales in compliance to ASTM E140 and ISO 18265
  • For Any Environment
      The Equotip 550 Portable Rockwell can be utilized for on-site, factory and lab environment with almost no limitation.
  • No thickness limitation of tested objects – perfect for thin metal sheets
  • Faster than stationary Rockwell hardness testers, yet very accurate
  • Purely material-independent method thanks to the direct measurement of the indentation depth
Accessories

Technical Specifications

Software / Workspace App
Display7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor
Pc SoftwareEquotip Link allowing direct reporting and custom reports
MemoryInternal 8 GB flash memory (> 1’000’000 measurements)
Sensor
Native Scaleµm, µinch
Available ScalesHB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA
Available ProbesPortable D.I.D (Rockwell Principle) Probe 50N (can also be connected directly to PC)
Combination With Other MethodsLeeb, UCI
Average Roughness Ra (µm / µinch)2/80
Minimum Mass (kg / lbs)No requirement
Minimum Thickness (mm / inch)10 x indentation depth
Instrument FirmwareAutomatic compensation for impact direction
Personalized user profiles and views
Integration in automated testing environments (incl. remote control)
Measurement wizards
Custom curve wizard
Combined method wizard
User guidance features
Custom report features
One-step calibration metric and imperial units support
Pc SoftwareEquotip Link allowing direct reporting and custom reports
Display7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor
MemoryInternal 8 GB flash memory (> 1’000’000 measurements)
ConnectionsUSB host / device and Ethernet
Measuring Range0 - 100 µm; 19 - 70 HRC; 35 - 1‘000 HV
Verification according toASTM E3246, DIN 50157, custom method, combined method
ProtectionIP54, fully rugged with shock-absorbing casing
Custom conversion curvesYes, 1-point shift, 2-point, polynomial
Measuring accuracy ± 0.8 µm; ~ ± 1.0 HRC over entire range